Parametric Rietveld refinement
نویسندگان
چکیده
In this paper the method of parametric Rietveld refinement is described, in which an ensemble of diffraction data collected as a function of time, temperature, pressure or any other variable are fitted to a single evolving structural model. Parametric refinement offers a number of potential benefits over independent or sequential analysis. It can lead to higher precision of refined parameters, offers the possibility of applying physically realistic models during data analysis, allows the refinement of 'non-crystallographic' quantities such as temperature or rate constants directly from diffraction data, and can help avoid false minima.
منابع مشابه
Automated parametric Rietveld refinement and its application to two- dimensional X-ray powder diffraction experiments
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ورودعنوان ژورنال:
- Journal of Applied Crystallography
دوره 40 شماره
صفحات -
تاریخ انتشار 2007